CISC and Qualcomm Put RAIN RFID Directly on the Mobile Processor

CISC RAIN Xplorer supports development of Qualcomm® Dragonwing™ Q-6690 processor with built-in UHF RFID reader capabilities.

Klagenfurt, Austria / Mountain View, CA, USA / San Diego, CA, USA

CISC Semiconductor announces a strategic technology collaboration with Qualcomm Technologies, Inc. to enable integrated UHF (RAIN) RFID reader functionality in the new Qualcomm® Dragonwing™ Q-6690 enterprise mobile processor. CISC’s RAIN Xplorer test platform has been selected to support the development and verification of the processor’s RAIN RFID performance.

By combining high-performance processing, advanced wireless connectivity, on-device AI and RAIN RFID in a single chipset, the Dragonwing Q-6690 is designed to power a new generation of smartphones, handhelds and industrial mobile devices that can read RAIN RFID tags directly at the edge – and convert data into decisions in real time.

Integrated RAIN RFID for Edge Intelligence

Until now, RAIN RFID reading in enterprise applications has typically required dedicated RFID readers or external modules attached to mobile devices. With the Dragonwing Q-6690, RFID moves into the heart of an enterprise-class mobile processor.

Integrating RAIN RFID at chipset level offers:

• Simplified device design – fewer external components and add-ons

• Lower size, weight and power – critical for handhelds and wearables

• Improved total cost of ownership – by consolidating multiple functions in one platform

• Real-time edge analytics – combining RFID data with AI, sensors and connectivity on the device

This opens up new possibilities for sectors such as:

• Logistics & supply chain: pallet, carton and item-level tracking, dock and yard operations

• Retail: accurate inventory, smart shelves, self-checkout and digital product passports

• Healthcare: tracking of medical devices, pharmaceuticals and consumables for higher patient safety

• Industrial & manufacturing: identification of tools, parts and products throughout production flows

CISC RAIN Xplorer as Core Test Technology

For the development of the Dragonwing Q-6690’s integrated RAIN RFID reader, Qualcomm Technologies relies on CISC’s RAIN Xplorer platform as the primary test and measurement solution.

RAIN Xplorer provides:

• High-precision RF measurements for sensitivity, read range and backscatter performance

• Conformance and performance testing of tags, readers and complete RFID systems

• Automation and scalability via a user interface and powerful APIs for custom test sequences

• Realistic test environments to evaluate performance under challenging operating conditions

Meeting stringent requirements for measurement accuracy, flexibility and throughput, RAIN Xplorer enables Qualcomm Technologies to verify and optimize the RAIN RFID behavior of the Dragonwing Q-6690 across a wide range of scenarios and use cases.

Executive Perspectives

“Integrating RAIN RFID directly into an enterprise-class mobile processor is an important step for the global RFID ecosystem,” said Dr. Markus Pistauer, CEO of CISC Semiconductor. “It can accelerate adoption, reduce system complexity and unlock entirely new applications – from instant access to product information in stores to enhancing traceability throughout complex supply chains. We are proud that our RAIN Xplorer platform supports Qualcomm Technologies in bringing this capability to market.”

“CISC’s test solutions played a key role in validating the RAIN RFID capabilities of the Qualcomm Dragonwing Q-6690,” said Vivek Mehta, Director of Product Management at Qualcomm Technologies, Inc. “By combining computation, connectivity, AI and integrated UHF RFID in one platform, the Q-6690 enables smarter enterprise devices that can read tags and act on data directly at the edge. Our collaboration with CISC helps ensure robust RFID performance and sets a new benchmark for enterprise-grade mobile technology.”

Enabling the Next Wave of Wireless IoT

The collaboration between CISC Semiconductor and Qualcomm Technologies underscores the importance of precise test technology in bringing new Wireless IoT capabilities to mass-market devices. Integrated RAIN RFID in a leading enterprise processor platform is expected to:

• Make RFID-enabled devices more accessible and easier to deploy

• Support large-scale item-level tracking and digital product passport initiatives

• Enhance transparency, efficiency and sustainability in global supply chains

For device manufacturers, solution providers and platform partners, this creates a fast track to design, test and launch mobile products with native RAIN RFID capabilities – without compromising on performance, standards compliance or time-to-market.

Get in Contact

You are planning to integrate RAIN RFID into chips, devices or end-to-end solutions and want to build on proven test technology?

• Discuss your project with our RFID experts

• Explore how RAIN Xplorer can support your silicon, device or system validation

• Define a tailored test concept for your roadmap