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CISC: Adding Trust in a Connected World

Ready for next level RFID production effectiveness

Ensuring high-quality RFID tags in high volumes is one of the key requirments for tag manufacturers as well as end-users. Performance testing of the tags on multiple test points can be done at high speed with CISC RAIN & NFC Xplorer inline tester in production process. Unique globally solution for high speed performance testing, encoding and encrypting and 100 % Quality of RFID inlays and tags during production process.

At CISC, we follow a more than 25-year passion to add TRUST in communication technologies by providing competitive and innovative products with customer-centered engineering solutions to increase their performance, conformance, interoperability, security, and privacy.

  • Concept: We support you from the earliest stages, with expertise in standardization, hardware–software partitioning, and interface development.

  • Design & Verification: Deep engineering know-how in NFC, RAIN RFID, BLE, UWB, Wireless Charging, and Automotive Electronics ensures robust, standards-compliant designs.

  • Implementation: Our solutions span firmware development, prototyping, and OEM module delivery — ready for integration into your products.

  • Application: We specialize in hardware-based security to enable trusted, secure communication in today’s wireless world.

  • Testing & Industrialization: We provide versatile, high-end test equipment for laboratory use, mass production, system integration, and quality assurance — ensuring reliability from development to deployment.

Dr. Markus Pistauer
Dr. Markus Pistauer
CEO and Founder

CISC Semiconductor delivers innovative solutions that boost the productivity and quality of RAIN and NFC inlay and label production. With deep RFID expertise and a focus on precision engineering, CISC helps manufacturers optimize quality and performance at every stage of production.

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Patrick Vallant

Patrick Vallant

Business Development