CISC: Adding Trust in a Connected World
Ready for next level RFID production effectiveness
Ensuring high-quality RFID tags in high volumes is one of the key requirments for tag manufacturers as well as end-users. Performance testing of the tags on multiple test points can be done at high speed with CISC RAIN & NFC Xplorer inline tester in production process. Unique globally solution for high speed performance testing, encoding and encrypting and 100 % Quality of RFID inlays and tags during production process.
At CISC, we follow a more than 25-year passion to add TRUST in communication technologies by providing competitive and innovative products with customer-centered engineering solutions to increase their performance, conformance, interoperability, security, and privacy.
Concept: We support you from the earliest stages, with expertise in standardization, hardware–software partitioning, and interface development.
Design & Verification: Deep engineering know-how in NFC, RAIN RFID, BLE, UWB, Wireless Charging, and Automotive Electronics ensures robust, standards-compliant designs.
Implementation: Our solutions span firmware development, prototyping, and OEM module delivery — ready for integration into your products.
Application: We specialize in hardware-based security to enable trusted, secure communication in today’s wireless world.
Testing & Industrialization: We provide versatile, high-end test equipment for laboratory use, mass production, system integration, and quality assurance — ensuring reliability from development to deployment.
“ CISC Semiconductor delivers innovative solutions that boost the productivity and quality of RAIN and NFC inlay and label production. With deep RFID expertise and a focus on precision engineering, CISC helps manufacturers optimize quality and performance at every stage of production. ”
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Patrick Vallant
Business Development
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